Deep Sub-100 nm Design Challenges

Tohru Furuyama. Deep Sub-100 nm Design Challenges. In Ninth Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD 2006), 30 August - 1 September 2006, Dubrovnik, Croatia. pages 9-16, IEEE Computer Society, 2006. [doi]

Abstract

Abstract is missing.