Daniel Fusco, Tiago R. Balen. Radiation effects in low power and ultra low power voltage references. In 17th Latin-American Test Symposium, LATS 2016, Foz do Iguacu, Brazil, April 6-8, 2016. pages 111-116, IEEE, 2016. [doi]
@inproceedings{FuscoB16,
title = {Radiation effects in low power and ultra low power voltage references},
author = {Daniel Fusco and Tiago R. Balen},
year = {2016},
doi = {10.1109/LATW.2016.7483349},
url = {http://dx.doi.org/10.1109/LATW.2016.7483349},
researchr = {https://researchr.org/publication/FuscoB16},
cites = {0},
citedby = {0},
pages = {111-116},
booktitle = {17th Latin-American Test Symposium, LATS 2016, Foz do Iguacu, Brazil, April 6-8, 2016},
publisher = {IEEE},
isbn = {978-1-5090-1331-9},
}