Takuya Futatsuyama, Norihiro Fujita, Naoya Tokiwa, Yoshihiko Shindo, Toshiaki Edahiro, Teruhiko Kamei, Hiroaki Nasu, Makoto Iwai, Koji Kato, Yasuyuki Fukuda, Naoaki Kanagawa, Naofumi Abiko, Masahide Matsumoto, Toshihiko Himeno, Toshifumi Hashimoto, Yi-Ching Liu, Hardwell Chibvongodze, Takamitsu Hori, Manabu Sakai, Hong Ding, Yoshiharu Takeuchi, Hitoshi Shiga, Norifumi Kajimura, Yasuyuki Kajitani, Kiyofumi Sakurai, Kosuke Yanagidaira, Toshihiro Suzuki, Yuko Namiki, Tomofumi Fujimura, Man Mui, Hao Nguyen, Seungpil Lee, Alex Mak, Jeffery Lutze, Tooru Maruyama, Toshiharu Watanabe, Takahiko Hara, Shigeo Ohshima. A 113mm2 32Gb 3b/cell NAND flash memory. In IEEE International Solid-State Circuits Conference, ISSCC 2009, Digest of Technical Papers, San Francisco, CA, USA, 8-12 February, 2009. pages 242-243, IEEE, 2009. [doi]
@inproceedings{FutatsuyamaFTSEKNIKFKAMHHLCHSDTSKKSYSNFMNLMLMWHO09,
title = {A 113mm2 32Gb 3b/cell NAND flash memory},
author = {Takuya Futatsuyama and Norihiro Fujita and Naoya Tokiwa and Yoshihiko Shindo and Toshiaki Edahiro and Teruhiko Kamei and Hiroaki Nasu and Makoto Iwai and Koji Kato and Yasuyuki Fukuda and Naoaki Kanagawa and Naofumi Abiko and Masahide Matsumoto and Toshihiko Himeno and Toshifumi Hashimoto and Yi-Ching Liu and Hardwell Chibvongodze and Takamitsu Hori and Manabu Sakai and Hong Ding and Yoshiharu Takeuchi and Hitoshi Shiga and Norifumi Kajimura and Yasuyuki Kajitani and Kiyofumi Sakurai and Kosuke Yanagidaira and Toshihiro Suzuki and Yuko Namiki and Tomofumi Fujimura and Man Mui and Hao Nguyen and Seungpil Lee and Alex Mak and Jeffery Lutze and Tooru Maruyama and Toshiharu Watanabe and Takahiko Hara and Shigeo Ohshima},
year = {2009},
doi = {10.1109/ISSCC.2009.4977398},
url = {http://dx.doi.org/10.1109/ISSCC.2009.4977398},
researchr = {https://researchr.org/publication/FutatsuyamaFTSEKNIKFKAMHHLCHSDTSKKSYSNFMNLMLMWHO09},
cites = {0},
citedby = {0},
pages = {242-243},
booktitle = {IEEE International Solid-State Circuits Conference, ISSCC 2009, Digest of Technical Papers, San Francisco, CA, USA, 8-12 February, 2009},
publisher = {IEEE},
isbn = {978-1-4244-3458-9},
}