Improved automatic exposure control using morphology-based disturbance recognition

Rolf Gaasbeek, Rick van der Maas, Mark den Hartog, Bram De Jager. Improved automatic exposure control using morphology-based disturbance recognition. In IEEE 11th International Symposium on Biomedical Imaging, ISBI 2014, April 29 - May 2, 2014, Beijing, Chin, Beijing, China. pages 1271-1274, IEEE, 2014. [doi]

Abstract

Abstract is missing.