Global Microwave Emission Depth Analyses from AMSR-E, SSMI, and MODIS

John F. Galantowicz, Jean-Luc Moncet, Pan Liang, Alan E. Lipton. Global Microwave Emission Depth Analyses from AMSR-E, SSMI, and MODIS. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2008, July 8-11, 2008, Boston, Massachusetts, USA, Proceedings. pages 334-337, IEEE, 2008. [doi]

Abstract

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