Ricardo Ochoa Gallardo, Alan J. Hu, André Ivanov, Maryam S. Mirian. Reducing Post-Silicon Coverage Monitoring Overhead with Emulation and Bayesian Feature Selection. In Diana Marculescu, Frank Liu, editors, Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015, Austin, TX, USA, November 2-6, 2015. pages 816-823, ACM, 2015. [doi]
Abstract is missing.