On Characterizing Near-Threshold SRAM Failures in FinFET Technology - researchr publication authors

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Shrikanth Ganapathy, John Kalamatianos, Keith Kasprak, Steven Raasch. On Characterizing Near-Threshold SRAM Failures in FinFET Technology. In Proceedings of the 54th Annual Design Automation Conference, DAC 2017, Austin, TX, USA, June 18-22, 2017. ACM, 2017. [doi]

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John Kalamatianos

Look up 'John Kalamatianos' in GoogleThis author has not been identified. Look up 'Keith Kasprak' in GoogleThis author has not been identified. Look up 'Steven Raasch' in Google

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