Shrikanth Ganapathy, John Kalamatianos, Keith Kasprak, Steven Raasch. On Characterizing Near-Threshold SRAM Failures in FinFET Technology. In Proceedings of the 54th Annual Design Automation Conference, DAC 2017, Austin, TX, USA, June 18-22, 2017. ACM, 2017. [doi]
@inproceedings{GanapathyKKR17,
title = {On Characterizing Near-Threshold SRAM Failures in FinFET Technology},
author = {Shrikanth Ganapathy and John Kalamatianos and Keith Kasprak and Steven Raasch},
year = {2017},
doi = {10.1145/3061639.3062292},
url = {http://doi.acm.org/10.1145/3061639.3062292},
researchr = {https://researchr.org/publication/GanapathyKKR17},
cites = {0},
citedby = {0},
booktitle = {Proceedings of the 54th Annual Design Automation Conference, DAC 2017, Austin, TX, USA, June 18-22, 2017},
publisher = {ACM},
isbn = {978-1-4503-4927-7},
}