Yiping Gao, Liang Gao, Xinyu Li 0001. A New Semi-Supervised Deep Learning Approach for Intelligent Defects Recognition. In IEEE International Conference on Networking, Sensing and Control, ICNSC 2020, Nanjing, China, October 30 - November 2, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.