Efficient Rare Failure Analysis Over Multiple Corners via Correlated Bayesian Inference - researchr publication

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Zhengqi Gao, Jun Tao 0001, Yangfeng Su, Dian Zhou, Xuan Zeng 0001, Xin Li 0001. Efficient Rare Failure Analysis Over Multiple Corners via Correlated Bayesian Inference. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(10):2029-2041, 2020. [doi]

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