Mingzhi Gao, Zuochang Ye, Yao Peng, Yan Wang, Zhiping Yu. A comprehensive model for gate delay under process variation and different driving and loading conditions. In 11th International Symposium on Quality of Electronic Design (ISQED 2010), 22-24 March 2010, San Jose, CA, USA. pages 406-412, IEEE, 2010. [doi]
Abstract is missing.