Zhen Gao, Lina Yan, Jinhua Zhu, Ruishi Han, Pedro Reviriego. Analysis of the Effects of Single Event Upsets (SEUs) on User Memory in FPGA Implemented Viterbi Decoders. In 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018. pages 1-6, IEEE Computer Society, 2018. [doi]
Abstract is missing.