Tomasz Garbolino, Andrzej Hlawiczka, Adam Kristof. Fast and low-area TPGs based on T-type flip-flops can be easily integrated to the scan path. In 5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000. pages 161-166, IEEE Computer Society, 2000. [doi]
Abstract is missing.