Impact de la Temperature sur la Fiabilite des Composants rf Ldmos de Puissance

M. Gares, H. Maanane, M. A. Belaïd, M. Masmoudi, J. Marcon, K. Mourgues, P. Bertram, Ph. Eudeline. Impact de la Temperature sur la Fiabilite des Composants rf Ldmos de Puissance. In Proceedings of the Canadian Conference on Electrical and Computer Engineering, CCECE 2007, May 7, 10, 2006, Ottawa Congress Centre, Ottawa, Canada. pages 382-385, IEEE, 2006. [doi]

Authors

M. Gares

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H. Maanane

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M. A. Belaïd

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M. Masmoudi

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J. Marcon

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K. Mourgues

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P. Bertram

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Ph. Eudeline

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