Special session 4A: New topics parametric yield and reliability of 3D integrated circuits: New challenges and solutions

Siddharth Garg, Diana Marculescu. Special session 4A: New topics parametric yield and reliability of 3D integrated circuits: New challenges and solutions. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 99, IEEE Computer Society, 2011. [doi]

Abstract

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