Esteban Garita-RodrÃguez, Renato Rimolo-Donadio, Rafael Zamora-Salazar. Challenges for High Volume Testing of Embedded IO Interfaces in Disaggregated Microprocessor Products. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 456-464, IEEE, 2022. [doi]
Abstract is missing.