A new method for quickly evaluating reversible and permanent components of the BTI degradation

X. Garros, Alexandre Subirats, Gilles Reimbold, F. Gaillard, C. Diouf, X. Federspiel, Vincent Huard, M. Rafik. A new method for quickly evaluating reversible and permanent components of the BTI degradation. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 6-1, IEEE, 2018. [doi]

Abstract

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