X. Garros, Alexandre Subirats, Gilles Reimbold, F. Gaillard, C. Diouf, X. Federspiel, Vincent Huard, M. Rafik. A new method for quickly evaluating reversible and permanent components of the BTI degradation. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 6-1, IEEE, 2018. [doi]
@inproceedings{GarrosSRGDFHR18,
title = {A new method for quickly evaluating reversible and permanent components of the BTI degradation},
author = {X. Garros and Alexandre Subirats and Gilles Reimbold and F. Gaillard and C. Diouf and X. Federspiel and Vincent Huard and M. Rafik},
year = {2018},
doi = {10.1109/IRPS.2018.8353688},
url = {https://doi.org/10.1109/IRPS.2018.8353688},
researchr = {https://researchr.org/publication/GarrosSRGDFHR18},
cites = {0},
citedby = {0},
pages = {6},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5479-8},
}