Three years of low-power image recognition challenge: Introduction to special session

Kent Gauen, Ryan Dailey, Yung-Hsiang Lu, Eunbyung Park, Wei Liu, Alexander C. Berg, Yiran Chen. Three years of low-power image recognition challenge: Introduction to special session. In 2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018. pages 700-703, IEEE, 2018. [doi]

Abstract

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