David Gauthier, Martin D. Levine, Alfred S. Malowany, N. Begnoche, G. Lefebvre. Measuring the Alignment accuracy of Surface Mount assembly Circuit Board masks. In Adam Krzyzak, Tony Kasvand, Ching Y. Suen, editors, Computer Vision and Shape Recognition. Volume 14 of World Scientific Series in Computer Science, pages 1-20, World Scientific, 1989. [doi]
Abstract is missing.