Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Craig Gaw, Thomas Arnold, Robert Martin, Lisa Zhang, Dragan Zupac. Evaluation of SiGe: C HBT intrinsic reliability using conventional and step stress methodologies. Microelectronics Reliability, 46(8):1272-1278, 2006. [doi]
Abstract is missing.