Sébastien Gebus, Kauko Leiviskä. Defect-related knowledge acquisition for decision support systems in electronics assembly. In Janan Zaytoon, Jean-Louis Ferrier, Juan Andrade-Cetto, Joaquim Filipe, editors, ICINCO 2007, Proceedings of the Fourth International Conference on Informatics in Control, Automation and Robotics, Intelligent Control Systems and Optimization, Angers, France, May 9-12, 2007. pages 270-275, INSTICC Press, 2007.
Abstract is missing.