Daniel Geist, Monica Farkas, Avner Landver, Yossi Lichtenstein, Shmuel Ur, Yaron Wolfsthal. Coverage-Directed Test Generation Using Symbolic Techniques. In Mandayam K. Srivas, Albert John Camilleri, editors, Formal Methods in Computer-Aided Design, First International Conference, FMCAD 96, Palo Alto, California, USA, November 6-8, 1996, Proceedings. Volume 1166 of Lecture Notes in Computer Science, pages 143-158, Springer, 1996.
Abstract is missing.