Importance-driven deep learning system testing

Simos Gerasimou, Hasan Ferit Eniser, Alper Sen 0001, Alper Cakan. Importance-driven deep learning system testing. In Gregg Rothermel, Doo-Hwan Bae, editors, ICSE '20: 42nd International Conference on Software Engineering, Seoul, South Korea, 27 June - 19 July, 2020. pages 702-713, ACM, 2020. [doi]

Abstract

Abstract is missing.