Specific aspects regarding evaluation of power cycling tests with SiC devices

Martina Gerlach, Peter Seidel, Josef Lutz. Specific aspects regarding evaluation of power cycling tests with SiC devices. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-6, IEEE, 2020. [doi]

Abstract

Abstract is missing.