Relevance Levels for Patent Mining

Fredric C. Gey, Ray R. Larson. Relevance Levels for Patent Mining. In Tetsuya Sakai, Mark Sanderson, Noriko Kando, editors, Proceedings of the 2nd International Workshop on Evaluating Information Access, EVIA 2008, National Center of Sciences, Tokyo, Japan, December 16, 2008. National Institute of Informatics (NII), 2008. [doi]

Abstract

Abstract is missing.