Maryam Ghane, Hamid R. Zarandi. Gate Merging: An NBTI Mitigation Method to Eliminate Critical Internal Nodes in Digital Circuits. In 24th Euromicro International Conference on Parallel, Distributed, and Network-Based Processing, PDP 2016, Heraklion, Crete, Greece, February 17-19, 2016. pages 786-791, IEEE, 2016. [doi]
Abstract is missing.