Valentin Gherman, Samuel Evain, Fabrice Auzanneau, Yannick Bonhomme. Programmable extended SEC-DED codes for memory errors. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 140-145, IEEE Computer Society, 2011. [doi]
@inproceedings{GhermanEAB11, title = {Programmable extended SEC-DED codes for memory errors}, author = {Valentin Gherman and Samuel Evain and Fabrice Auzanneau and Yannick Bonhomme}, year = {2011}, doi = {10.1109/VTS.2011.5783774}, url = {http://dx.doi.org/10.1109/VTS.2011.5783774}, researchr = {https://researchr.org/publication/GhermanEAB11}, cites = {0}, citedby = {0}, pages = {140-145}, booktitle = {29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA}, publisher = {IEEE Computer Society}, }