Programmable extended SEC-DED codes for memory errors

Valentin Gherman, Samuel Evain, Fabrice Auzanneau, Yannick Bonhomme. Programmable extended SEC-DED codes for memory errors. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 140-145, IEEE Computer Society, 2011. [doi]

@inproceedings{GhermanEAB11,
  title = {Programmable extended SEC-DED codes for memory errors},
  author = {Valentin Gherman and Samuel Evain and Fabrice Auzanneau and Yannick Bonhomme},
  year = {2011},
  doi = {10.1109/VTS.2011.5783774},
  url = {http://dx.doi.org/10.1109/VTS.2011.5783774},
  researchr = {https://researchr.org/publication/GhermanEAB11},
  cites = {0},
  citedby = {0},
  pages = {140-145},
  booktitle = {29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA},
  publisher = {IEEE Computer Society},
}