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Memory reliability improvements based on maximized error-correcting codes

Valentin Gherman, Samuel Evain, Yannick Bonhomme. Memory reliability improvements based on maximized error-correcting codes. In 17th IEEE European Test Symposium, ETS 2012, May 28th - June 1st 2012, Annecy, France. pages 1-6, IEEE Computer Society, 2012. [doi]

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Valentin Gherman

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Samuel Evain

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Yannick Bonhomme

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