Memory Reliability Improvement Based on Maximized Error-Correcting Codes

Valentin Gherman, Samuel Evain, Yannick Bonhomme. Memory Reliability Improvement Based on Maximized Error-Correcting Codes. J. Electronic Testing, 29(4):601-608, 2013. [doi]

Authors

Valentin Gherman

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Samuel Evain

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Yannick Bonhomme

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