Valentin Gherman, Samuel Evain, Bastien Giraud. Binary Linear ECCs Optimized for Bit Inversion in Memories with Asymmetric Error Probabilities. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 298-301, IEEE, 2020. [doi]
@inproceedings{GhermanEG20,
title = {Binary Linear ECCs Optimized for Bit Inversion in Memories with Asymmetric Error Probabilities},
author = {Valentin Gherman and Samuel Evain and Bastien Giraud},
year = {2020},
doi = {10.23919/DATE48585.2020.9116531},
url = {https://doi.org/10.23919/DATE48585.2020.9116531},
researchr = {https://researchr.org/publication/GhermanEG20},
cites = {0},
citedby = {0},
pages = {298-301},
booktitle = {2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020},
publisher = {IEEE},
isbn = {978-3-9819263-4-7},
}