Valentin Gherman, Emna Farjallah, Jean-Marc Armani, Marcelino Seif, Luigi Dilillo. Improvement of the tolerated raw bit error rate in NAND flash-based SSDs with the help of embedded statistics. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-9, IEEE, 2017. [doi]
Abstract is missing.