Thermal aging model of InP/InGaAs/InP DHBT

S. Ghosh, F. Marc, C. Maneux, B. Grandchamp, G. A. Koné, T. Zimmer. Thermal aging model of InP/InGaAs/InP DHBT. Microelectronics Reliability, 50(9-11):1554-1558, 2010. [doi]

Abstract

Abstract is missing.