Slew-Rate Monitoring Circuit for On-Chip Process Variation Detection

Amlan Ghosh, Rahul M. Rao, Jae-Joon Kim, Ching-Te Chuang, Richard B. Brown. Slew-Rate Monitoring Circuit for On-Chip Process Variation Detection. IEEE Trans. VLSI Syst., 21(9):1683-1692, 2013. [doi]

Abstract

Abstract is missing.