Nicola Di Gruttola Giardino, Francesco Angione, Paolo Bernardi, Tommaso Foscale, Claudia Bertani, Vincenzo Tancorre. A Flexible FPGA-Based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2024, Didcot, United Kingdom, October 8-10, 2024. pages 1-6, IEEE, 2024. [doi]
Abstract is missing.