Georges Gielen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Baris Esen. Design and test of analog circuits towards sub-ppm level. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-2, IEEE, 2014. [doi]
Abstract is missing.