Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies

Georges G. E. Gielen, P. De Wit, E. Maricau, J. Loeckx, J. Martin-Martinez, Ben Kaczer, Guido Groeseneken, R. Rodríguez, M. Nafría. Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies. In Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008. pages 1322-1327, 2008. [doi]

Abstract

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