Investigation of diode triggered silicon control rectifier turn-on time during ESD events

Ahmed Y. Ginawi, Robert Gauthier, Tian Xia. Investigation of diode triggered silicon control rectifier turn-on time during ESD events. In Massimo Alioto, Hai Helen Li, Jürgen Becker, Ulf Schlichtmann, Ramalingam Sridhar, editors, 30th IEEE International System-on-Chip Conference, SOCC 2017, Munich, Germany, September 5-8, 2017. pages 175-178, IEEE, 2017. [doi]

Abstract

Abstract is missing.