Olivier Ginez, Jean Michel Portal, Ch. Muller. Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections. In 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009. pages 61-66, IEEE Computer Society, 2009. [doi]
Abstract is missing.