Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell. Defect Analysis for Delay-Fault BIST in FPGAs. In 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 7-9 July 2003, Kos Island, Greece. pages 124-128, IEEE Computer Society, 2003. [doi]
Abstract is missing.