F. Giuliano, R. Depetro, Giuseppe Croce, A. N. Tallarico, Susanna Reggiani, Antonio Gnudi, Enrico Sangiorgi, Claudio Fiegna, Mattia Rossetti, A. Molfese, S. Manzini. TCAD predictions of hot-electron injection in p-type LDMOS transistors. In 49th European Solid-State Device Research Conference, ESSDERC 2019, Cracow, Poland, September 23-26, 2019. pages 86-89, IEEE, 2019. [doi]
Abstract is missing.