Markus Glaß, Birgit Möller, Anne Zirkel, Kristin Wächter, Stefan Hüttelmaier, Stefan Posch. Scratch Assay Analysis with Topology-Preserving Level Sets and Texture Measures. In Jordi Vitrià, João Miguel Raposo Sanches, Mario Hernández, editors, Pattern Recognition and Image Analysis - 5th Iberian Conference, IbPRIA 2011, Las Palmas de Gran Canaria, Spain, June 8-10, 2011. Proceedings. Volume 6669 of Lecture Notes in Computer Science, pages 100-108, Springer, 2011. [doi]
Abstract is missing.