C. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart. Electrical modeling of the effect of beam profile for pulsed laser fault injection. Microelectronics Reliability, 49(9-11):1143-1147, 2009. [doi]
@article{GodlewskiPLL09,
title = {Electrical modeling of the effect of beam profile for pulsed laser fault injection},
author = {C. Godlewski and Vincent Pouget and Dean Lewis and Mathieu Lisart},
year = {2009},
doi = {10.1016/j.microrel.2009.07.037},
url = {http://dx.doi.org/10.1016/j.microrel.2009.07.037},
tags = {modeling, C++},
researchr = {https://researchr.org/publication/GodlewskiPLL09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {9-11},
pages = {1143-1147},
}