Norman Goldblatt, Martin Leibowitz, William Lo. Unique and Practical IC Timing Analysis Tool Utilizing Intrinsic Photon Emission. Microelectronics Reliability, 41(9-10):1507-1512, 2001.
@article{GoldblattLL01,
title = {Unique and Practical IC Timing Analysis Tool Utilizing Intrinsic Photon Emission},
author = {Norman Goldblatt and Martin Leibowitz and William Lo},
year = {2001},
tags = {analysis},
researchr = {https://researchr.org/publication/GoldblattLL01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {9-10},
pages = {1507-1512},
}