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An Automatic Test Equipment Database System Used in the Generation and Analysis of Fault Statistics at the Printed Circuit Board Level

W. L. Goldie, P. F. Macready. An Automatic Test Equipment Database System Used in the Generation and Analysis of Fault Statistics at the Printed Circuit Board Level. In Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. pages 350-361, IEEE Computer Society, 1982.

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