An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging Effects

Andres F. Gomez, VĂ­ctor H. Champac. An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging Effects. J. Electronic Testing, 35(1):87-100, 2019. [doi]

Abstract

Abstract is missing.