Automatic classification of skin lesions using geometrical measurements of adaptive neighborhoods and local binary patterns

Ví González-Castro, Johan Debayle, Yanal Wazaefi, M. Rahim, C. Gaudy, J.-J. Grob, Bernard Fertil. Automatic classification of skin lesions using geometrical measurements of adaptive neighborhoods and local binary patterns. In 2015 IEEE International Conference on Image Processing, ICIP 2015, Quebec City, QC, Canada, September 27-30, 2015. pages 1722-1726, IEEE, 2015. [doi]

@inproceedings{Gonzalez-Castro15,
  title = {Automatic classification of skin lesions using geometrical measurements of adaptive neighborhoods and local binary patterns},
  author = {Ví González-Castro and Johan Debayle and Yanal Wazaefi and M. Rahim and C. Gaudy and J.-J. Grob and Bernard Fertil},
  year = {2015},
  doi = {10.1109/ICIP.2015.7351095},
  url = {http://dx.doi.org/10.1109/ICIP.2015.7351095},
  researchr = {https://researchr.org/publication/Gonzalez-Castro15},
  cites = {0},
  citedby = {0},
  pages = {1722-1726},
  booktitle = {2015 IEEE International Conference on Image Processing, ICIP 2015, Quebec City, QC, Canada, September 27-30, 2015},
  publisher = {IEEE},
  isbn = {978-1-4799-8339-1},
}