Alberto González-Sanchez, Rui Abreu, Hans-Gerhard Groß, Arjan J. C. van Gemund. An empirical study on the usage of testability information to fault localization in software. In William C. Chu, W. Eric Wong, Mathew J. Palakal, Chih-Cheng Hung, editors, Proceedings of the 2011 ACM Symposium on Applied Computing (SAC), TaiChung, Taiwan, March 21 - 24, 2011. pages 1398-1403, ACM, 2011. [doi]
Abstract is missing.