Alberto González-Sanchez, Hans-Gerhard Gross, Arjan J. C. van Gemund. Modeling the Diagnostic Efficiency of Regression Test Suites. In Fourth International IEEE Conference on Software Testing, Verification and Validation, ICST 2012, Berlin, Germany, 21-25 March, 2011, Workshop Proceedings. pages 634-643, IEEE Computer Society, 2011. [doi]
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