Kevin W. Gorman, Darren Anand, Gary Pomichter, William R. Corbin. Low Cost Test of High Bandwidth Embedded Memories. In Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006, DoubleTree Hotel, San Jose, California, USA, September 10-13, 2006. pages 445-448, IEEE, 2006. [doi]
Abstract is missing.